Layouts of a test chip for evaluating symmetrical and asymmetrical pad
Download scientific diagram | Layouts of a test chip for evaluating symmetrical and asymmetrical pad structures. Pads are located outside of ground plane in left half, whereas they are located on ground plane on right half. from publication: Experimental and simulation results of a symmetrical pad to reduce a stray ground current in superconducting integrated circuits | The method of extracting bias current is widely used in large scale SFQ circuits to avoid harmful effect by spreading the bias return current on a ground plane, which causes malfunction or degrading the operating margin by the stray magnetic field. Although extracting the | Bias (Epidemiology), Superconductivity and Magnetic Field | ResearchGate, the professional network for scientists.
Layouts of a test chip for evaluating symmetrical and asymmetrical pad
Simulated field distribution at the wave ports of a GMSL.
Influence of pad size, distance between bias pads and bias extraction
Simulated field distribution at the wave ports of a GMSL.
Simulated field distribution at the wave ports of a GMSL.
Layouts of a test chip for evaluating symmetrical and asymmetrical pad
Colour contour maps of simulated ground current in the case of bias
Nobuyuki YOSHIKAWA, PhD, Yokohama National University, Yokohama, Department of Physics, Electrical and Computer Engineering
Nobuyuki YOSHIKAWA, PhD, Yokohama National University, Yokohama, Department of Physics, Electrical and Computer Engineering
Hideo SUZUKI, Yokohama National University, Yokohama, Institute of Advanced Sciences
Hideo SUZUKI, Yokohama National University, Yokohama, Institute of Advanced Sciences
Hideo SUZUKI, Yokohama National University, Yokohama, Institute of Advanced Sciences
Nobuyuki YOSHIKAWA, PhD, Yokohama National University, Yokohama, Department of Physics, Electrical and Computer Engineering
Simulated field distribution at the wave ports of a GMSL.
